| XPS、AFM和ToF-SIMS的工作原理及在植物纤维表面分析中的应用 |
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| 引用本文： | 雷晓春,林鹿,李可成.XPS、AFM和ToF-SIMS的工作原理及在植物纤维表面分析中的应用[J].中国造纸学报,2006,21(4):97-101. |
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| 作者姓名： | 雷晓春 林鹿 李可成 |
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| 作者单位： | 1. 华南理工大学制浆造纸工程国家重点实验室,广东,广州,510641
2. 加拿大新布朗斯克大学制浆造纸研究中心,加拿大 |
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| 摘 要： | 介绍了先进的表面分析仪器化学分析电子能谱(XPS)、原子力显微镜(AFM)、含飞行时间分析器的二次离子质谱仪(ToF-SIMS)的工作原理,回顾了近年来它们在植物纤维表面分析中的成功应用,综合利用XPS、AFM及ToF-SIMS方法,可分析和解决制浆造纸过程中的现象和问题。
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| 关 键 词： | XPS AFM ToF-SIMS 原理 纤维表面 |
| 文章编号： | 1000-6842（2006）04-0097-05 |
| 修稿时间： | 2006-07-23 |
Fiber Surface Analysis with XPS, AFM, Tof-SIMS: Principle and Application |
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| LEI Xiao-chun,LU Lin,LI Ke-cheng.Fiber Surface Analysis with XPS, AFM, Tof-SIMS: Principle and Application[J].Transactions of China Pulp and Paper,2006,21(4):97-101. |
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| Authors: | LEI Xiao-chun LU Lin LI Ke-cheng |
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| Affiliation: | 1. State Key. Lab of Pulp and Paper Engineering, South China University of Technology, Guangzhou, Guangdong Provirwe, 510640; 2. Department Chemical Engineering and Limerick Pulp and Paper Center, Univenity of New Brunswick, Fredericton, NB, Canada |
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| Abstract: | The working principles of several advanced surface analysis instrument including X-ray photoelectron spectroscopy(XPS),atomic force microscopy(AFM) and time of flight secondary ion mass spectroscopy(ToF-SIMS) are introduced, their successful application in fiber surface analysis recent years is reviewed. They can be used and complement each other to analyze and solve the problems which appear in pulping and papermaking process. |
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| Keywords: | X-ray photoelectron spectroscopy atomic force microscopy time of flight secondary ion mass spectroscopy working principle fiber surface |
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