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Possible Electrical Double-Layer Contribution to the Equilibrium Thickness of Intergranular Glass Films in Polycrystalline Ceramics
Authors:David R Clarke  Thomas M Shaw  Albert P Philipse  Roger G Horn
Affiliation:Materials Department, University of California, Santa Barbara, California 93106;IBM Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598;Van't Hoff Laboratorium, Rijksuniversiteit te Utrecht, 3508 TB Utrecht, The Netherlands;Schools of Applied Physics and Chemical Technology, University of South Australia, The Levels, SA 5095. Australia
Abstract:The plausibility of the entropic repulsion of electrical double layers acting to stabilize an equilibrium thickness of intergranular glass films in polycrystalline ceramics is explored. Estimates of the screening length, surface potential, and surface charge required to provide a repulsive force sufficiently large to balance the attractive van der Waals and capillary forces for observable thicknesses of intergranular film are calculated and do not appear to be beyond possibility. However, it has yet to be established whether crystalline particles in a liquid-phase sintering medium possess an electrical double layer at high temperatures. If they do, such a surface charge layer may well have important consequences not only for liquid-phase sintering but also for high-frequency electrical properties and microwave sintering of ceramics containing a liquid phase.
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