Circuit of time-domain quality factor measurement in 0.35μm CMOS process |
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Authors: | REN Xiaojiao ZHANG Ming LLASER Nicolas YUE Baihe ZHUANG Yiqi |
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Affiliation: | (1. School of Microelectronics, Xidian Univ., Xi'an 710071, China;2. IEF, Univ. Paris-Sud, Université Paris-Saclay, Orsay 91405) |
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Abstract: | Based on the time-domain quality factor (Q-factor) measurement principle, an architecture which not only achieves an accurate Q-factor at the specific frequency but also covers a range of frequencies without any loss in Q-factor measurement accuracy is proposed. Based on a reconfigurable structure, an improved peak detector compensation method is presented. To guide the design of such an architecture, a theoretical analysis for reaching the required accuracy and expanding the input frequency range has been first developed in this paper. Besides, the system power dissipation can be reduced by 7.5% thanks to the improved digital control logic. In this paper, circuit is realized in a 0.35μm CMOS process for the first time. With the 5V supply voltage and 1MHz input frequency, the post-layout simulation result have demonstrated that an accuracy of the Q-factor measurement is within 0.2%. Furthermore, the input frequency range that can be measured by this circuit is extended from 100kHz to 1.5MHz with the same accuracy. |
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Keywords: | quality factor (Q-factor) time domain measurement on-chip |
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