Aperture sampling requirements in planar near-field and patterncalculations

The paper covers a simple idea. If we sample an aperture, we can obtain valid patterns over a limited angular region about the normal to the aperture. The same expression can be used with near-field measurements. I reduced the expression to a nomograph. A nomograph allows one to rapidly test various choices. In the second half of the paper, I answer questions caused by the February column which discussed polarization (Milligan, IEEE Antennas. Propag. Mag., vol.38, no.1, p.56-8, 1996)