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Glass film structure of grain-oriented silicon steel using aluminum nitride as an inhibitor |
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| Authors: | H. Fujii S. Yamazaki T. Nagashima H. Kobayashi H. Masui M. Shiozaki |
| Affiliation: | (1) Technical Development Bureau. Steel Research Labora tories, Electromagnetic Materials, Nippon Steel Corporation, 299-12 Futtsu, Japan;(2) Technical Development Bureau, Advanced Materials & Technology, Materials Characterization, Nippon Steel Corporation, 211 Kawasaki, Japan;(3) Nittech Research Corporation, 67l Himeji, Japan |
| Abstract: | The composition and structure of glass (silicate) film formed during secondary recrystallization annealing of grain- oriented 3% Si steel using aluminum nitride as an inhibitor was investigated. The glass film consisted of spinel (MgO AI2O3) and forsterite [2(MgO) SiO2], and the AI2O3 component of spinel originates from aluminum generated by the decomposition of aluminum nitride. From the location and the morphology of the spinel, it was concluded that aluminum reacts with forsterite to form spinel. |
| Keywords: | aluminum concentration aluminum nitride characterization forsterite glass film structure grain-oriented silicon steel SEM/EPMA analysis spinel spinel formation mechanism X-ray diffraction analysis |
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