两相界面几何错配的高分辨电子显微象分析

从界面两相的几何参数出发,计算界面两侧点阵平面的错配,并用实验观测的界面位错排布加以证实,这是相间界面分析的常用方法。本文进一步分析了那些从几何失配来预言界面会出现失配位错,但高分辨电子显微象却显示良好匹配的情况。说明在一定条件下,两相的结构相似性会容纳较大的几何失配。

A HREM IMAGE ANALYSIS FOR GEOMETRICAL MISMATCH AT INTERFACES

The normal interface analysis procedure is that to calculate the mismatch between two sets of lattice planes of the two corresponding matrix phases based upon the lattice parameters, then to compare the rseult with the observed interface dislocation arrangement. This work investigates the cases where misfit dislocations should exist at the interface according to prediction from geometrical mismatch analysis, however, very good coherent match at such interface in fact appears in the observed high resolution electron microscopy (HREM) images. The fact implies that the structural similarity between two phases can accommodate a rather large geometrical mismatch at the interface.