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X-Ray Measurement of Residual Stress in Plastic Bonded Explosives |
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| Authors: | Yong Zhihua Zhu Shifu Zhao Beijun Chen Jinghua Zhang Weibin Wei Xingwen |
| Abstract: | The X-ray diffractive technology was adopted for tentative study of plastic bonded explosive. The datum of some new diffractive peaks in standard PDF cards were added. The effects of strain to interplanar distance and crystal size of the explosive were studied. The results show that grain size of plastic bonded explosive is decreasing with the increasing of the pressure, and the residual stress of the explosive is draw stress. |
| Keywords: | residual stress X-ray diffractive technology plastic bonded explosive |
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