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A set of test and measuring equipment in the field of electromagnetic compatibility |
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| Authors: | V. E. Bobikov L. A. Busygina G. D. Domashenko V. P. Lisitsyn M. G. Nikiforov A. A. Chumakov |
| Abstract: | Instrumental support of scientific research and EMC tests are considered. Sample generators of field and conducted interferences of microsecond, nanosecond, and subnanosecond ranges are given. The structure of an optoelectronic electromagnetic field gage is described. Characteristics of TEM and GTEM chambers are given. |
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