| Tm3＋：YAG晶体非均匀展宽特性测量 |
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| 引用本文： | 朱维伟,马秀荣,彭雪峰,张双根,任广军,刘远来. Tm3＋：YAG晶体非均匀展宽特性测量[J]. 光电子．激光, 2011, 0(10): 1546-1550 |
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| 作者姓名： | 朱维伟 马秀荣 彭雪峰 张双根 任广军 刘远来 |
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| 作者单位： | 天津理工大学计算机与通信工程学院通信器件教育部工程研究中心； 天津理工大学电子信息工程学院,薄膜电子与通信器件天津市重点实验室； 天津理工大学电子信息工程学院薄膜电子与通信器件天津市重点实验室；;天津理工大学计算机与通信工程学院通信器件教育部工程研究中心； 天津理工大学电子信息工程学院,薄膜电子与通信器件天津市重点实验室； 天津理工大学电子信息工程学院薄膜电子与通信器件天津市重点实验室；;天津理工大学电子信息工程学院薄膜电子与通信器件天津市重点实验室；;天津理工大学电子信息工程学院薄膜电子与通信器件天津市重点实验室；;天津理工大学电子信息工程学院薄膜电子与通信器件天津市重点实验室；;天津理工大学计算机与通信工程学院通信器件教育部工程研究中心； 天津理工大学电子信息工程学院,薄膜电子与通信器件天津市重点实验室； 天津理工大学电子信息工程学院薄膜电子与通信器件天津市重点实验室； |
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| 基金项目： | 天津市科技创新专项资金资助项目(10FDGX00400) |
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| 摘 要： | 提出了一种测量Tm3＋：YAG晶体非均匀展宽特性的新方法。利用Tm3＋：YAG晶体对不同频率的光吸收能量不同这一属性，通过透射光强的变化，得到晶体非均匀展宽特性。从单个激发态粒子的阻尼谐振子模型出发，理论上给出了测量方法的数学模型。实验采用线性啁啾激光作光源，用光电探测器（PD）接收透射光功率变化。该系统波长分辨率为0...
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| 关 键 词： | Tm3+：YAG晶体 非均匀展宽 线性啁啾 |
Measurement of inhomogeneous broadening width properties of Tm3+:YAG crystal |
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| ZHU Wei-wei,MA Xiu-rong,PENG Xue-feng,ZHANG Shuang-gen,REN Guang-jun and LIU Yuan-lai. Measurement of inhomogeneous broadening width properties of Tm3+:YAG crystal[J]. Journal of Optoelectronics·laser, 2011, 0(10): 1546-1550 |
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| Authors: | ZHU Wei-wei MA Xiu-rong PENG Xue-feng ZHANG Shuang-gen REN Guang-jun LIU Yuan-lai |
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| Affiliation: | Engineering Research Center on Communication Devices,Ministry of Education of China,School of Computer and Communication Engineering,Tianjin University of Technology,Tianjin 300384,China; Tianjin Key Laboratory of Film Electronic and Communication Device,School of Electronic Information Engineering,Tianjin University of Technology,Tianjin 300384,China;Engineering Research Center on Communication Devices,Ministry of Education of China,School of Computer and Communication Engineering,Tianjin University of Technology,Tianjin 300384,China; Tianjin Key Laboratory of Film Electronic and Communication Device,School of Electronic Information Engineering,Tianjin University of Technology,Tianjin 300384,China;Tianjin Key Laboratory of Film Electronic and Communication Device,School of Electronic Information Engineering,Tianjin University of Technology,Tianjin 300384,China;Tianjin Key Laboratory of Film Electronic and Communication Device,School of Electronic Information Engineering,Tianjin University of Technology,Tianjin 300384,China;Tianjin Key Laboratory of Film Electronic and Communication Device,School of Electronic Information Engineering,Tianjin University of Technology,Tianjin 300384,China;Engineering Research Center on Communication Devices,Ministry of Education of China,School of Computer and Communication Engineering,Tianjin University of Technology,Tianjin 300384,China; Tianjin Key Laboratory of Film Electronic and Communication Device,School of Electronic Information Engineering,Tianjin University of Technology,Tianjin 300384,China |
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| Abstract: | This paper presents a new method of testing inhomogeneous broadening absorption properties of Tm3+:YAG crystal.Using the property of different absorbing energies at different frequencies,the inhomogeneous broadening absorption properties of the Tm3+:YAG crystal are obtained.We start from a harmonic oscillator model of particle at a single excited state.A theoretical model of the proposed method is also put forward.Experimental system uses linear chirped light as the source,and the change of ligh... |
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| Keywords: | Tm3+:YAG crystal inhomogeneous broadening linear-chirped |
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