| 嵌入式系统测试的发展 |
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| 引用本文： | 张建伟,叶东升. 嵌入式系统测试的发展[J]. 单片机与嵌入式系统应用, 2011, 11(2): 5-7 |
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| 作者姓名： | 张建伟 叶东升 |
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| 作者单位： | 航天软件评测中心,北京,100854 |
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| 摘 要： | 目前,我国的嵌入式系统测试技术处于起步时期的快速发展阶段,本土厂商自主研发的产品拥有良好的应用前景.本文围绕嵌入式系统测试的概念、应用领域和国内发展状况进行了综合阐述.
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| 关 键 词： | 嵌入式系统测试 软件测试 故障注入 |
Development of Embedded System Testing |
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| Zhang Jianwei,Ye Dongsheng. Development of Embedded System Testing[J]. Microcontrollers & Embedded Systems, 2011, 11(2): 5-7 |
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| Authors: | Zhang Jianwei Ye Dongsheng |
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| Affiliation: | Zhang Jianwei,Ye Dongsheng(Space Software Testing Center,Beijing 100854,China) |
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| Abstract: | Chinese embedded system testing technology has just entered its golden age of the starting period.Native products have good application prospect.This paper introduces the basic concept,application fields and domestic development status of embedded system testing. |
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| Keywords: | embedded system testing software testing fault injection |
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