Estimation of surface roughness parameters from dual-frequencymeasurements of radar backscattering coefficients |
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Authors: | Mo T Wang JR Schmugge TJ |
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Affiliation: | Comput. Sci. Corp., Beltsville, MD; |
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Abstract: | A simple model was developed for estimating the surface roughness parameters of a bare soil field. The model uses a set of dual-frequency measurements of the field's radar backscattering coefficients, which can be matched to calculated results obtained with assumed values for the surface roughness parameters, as represented by the surface height standard deviation σ and its correlation lengths. Scatter plots of measured and calculated radar backscattering coefficients at the C -band (4.25-GHz) frequency versus those at L-band (1.5 GHz) show that it is feasible to estimate the surface roughness parameters using this technique. The estimated values for σ are in excellent agreement with those of measurements. However, there are discrepancies between the estimated and measured values for the correlation length L. For a very rough field, the geometrical optics model could be more appropriate for modeling the C-band data |
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