Observation of 4He Superfluidity in 1.8 nm-Pores |
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| Authors: | H Ikegami Y Yamato T Okuno J Taniguchi N Wada |
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| Affiliation: | (1) RIKEN (The Institute of Physical and Chemical Research), Hirosawa 2-1, Wako, Saitama 351-0198, Japan;(2) Basic Science, Graduate School of Arts and Sciences, University of Tokyo, Komaba 3-8-1, Meguro-ku, Tokyo 153-8902, Japan;(3) Department of Applied Physics and Chemistry, The University of Electro-Communications, Chofugaoka 1-5-1, Chofu, Tokyo 182-8585, Japan;(4) Department of physics, Graduate School of Science, Nagoya University, Chikusa-ku, Nagoya 468-8602, Japan |
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| Abstract: | No Heading Superfluid properties of 4He adsorbed in uniform straight pore 1.8 nm in diameter were studied using a torsional oscillator. In the pore, the first one or two layers of adsorbed. 4He are solid, therefore the pore diameter is effectively reduced to about 1.1 or 0.4 nm. In order to investigate whether 4He becomes superfluid in such a narrow pore, we performed the oscillator experiments for two cases: 4He is adsorbed (1) on the bare substrate and (2) on the pore completely filled with N2 atoms. In the latter case, only superfluid film coating the surface of the substrate grain can be detected. Compared with this case, an additional superfluid signal originating from 4He in the pore is observed for the bare substrate. This strongly suggests that 4He in the pore is superfluid.PACS numbers: 67.40.–w, 67.70.+n |
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