| 校准件端口尺寸测量方法及不确定度分析 |
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| 引用本文： | 刘宏. 校准件端口尺寸测量方法及不确定度分析[J]. 电子质量, 2010, 0(2): 51-51,53 |
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| 作者姓名： | 刘宏 |
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| 作者单位： | 中国电子科技集团公司第41研究所,山东,青岛,266555 |
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| 摘 要： | 文章简单介绍校准件端口尺寸的测量方法，主要分析了影响其测量不确定度的各个因素，并对引入的测量不确定度的各分量进行评定，给出完整的端口尺寸的测量结果。
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| 关 键 词： | 测量不确定度 分析 端口尺寸 |
Uncertainty of Measurement Analyze for Pin Depth of Calibration Kits |
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| Liu Hong. Uncertainty of Measurement Analyze for Pin Depth of Calibration Kits[J]. Electronics Quality, 2010, 0(2): 51-51,53 |
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| Authors: | Liu Hong |
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| Affiliation: | The 41st Research Institute;CETC;Shandong Qingdao 266555 |
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| Abstract: | This paper simply introduces measurement method for pin depth of calibration kits,mainly analyses some factors for effecting uncertainty of measurement,and evaluates the uncertainty of measurement,and the measurement result integrated for pin depth was given. |
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| Keywords: | uncertainty of measurement analyze pin depth |
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