Highly sensitive AMS measurements of 53Mn |
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| Authors: | M Poutivtsev I Dillmann T Faestermann K Knie G Korschinek J Lachner A Meier G Rugel A Wallner |
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| Affiliation: | 1. Technische Universität München, Fakultät für Physik, James-Franck-Straße 1, 85747 Garching, Germany;2. Universität Wien, Fakultät für Physik, Währinger Strasse 17, A-1090 Wien, Austria |
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| Abstract: | Our AMS system, with the gas-filled detector system GAMS, has been optimized for measurements with 53Mn. A high sensitivity has been achieved. A newly installed cesium sputter ion source yields an improved emittance, and thus a higher mass resolution. By the extraction of the manganese molecule MnF? instead of MnO? we can suppress the isobaric chromium background in the ion source by more than a factor of three. The GAMS system achieves an isobaric suppression factor of about 3 × 108. Measurements on blank samples yielded upper limits for the 53Mn/55Mn ratios of 7 × 10?15. |
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