| 故障分解的并行测试生成算法 |
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| 引用本文： | 李颖悟,颜学龙,郭学仁. 故障分解的并行测试生成算法[J]. 桂林电子科技大学学报, 1999, 19(4): 44-47 |
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| 作者姓名： | 李颖悟 颜学龙 郭学仁 |
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| 作者单位： | 桂林电子工业学院,计算机分院 |
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| 基金项目： | 国防预研基金;B96002; |
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| 摘 要： | 并行测试技术是解决当今大规模电路测试难题的一个重要手段.故障分解又是最基本的并行测试方法.详细论述了故障分解的理论和两种故障分解算法的基本模型,并且在实现了一个基于FAN算法的并行测试生成系统的基础上详细说明了故障分解的并行测试生成算法的具体实现.在系统实现中,将故障模拟在全故障集上进行,并对C/S通信进行了多线程处理,取得了比较好的加速效果.
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| 关 键 词： | 并行测试 故障分解 测试矢量 输入锥 故障模拟 |
| 修稿时间： | :1999-09-10 |
The Parallel Test Generation Algorithms Based on Fault Allocation |
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| Li Yingwu,Yan Xuelong,Guo Xueren. The Parallel Test Generation Algorithms Based on Fault Allocation[J]. Journal of Guilin University of Electronic Technology, 1999, 19(4): 44-47 |
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| Authors: | Li Yingwu Yan Xuelong Guo Xueren |
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| Abstract: | The parallel testgeneration technology is an important method to resolve the difficult problem of test onmassive circuits. And the fault parallelism is the basic method of parallel test. Thetheory of fault allocation and two basic models of fault allocation are discussed indetail in the paper. Then a concrete implementing is explained carefully after realizingthe parallel test based on the FAN Algorithm. The fault simulating is completed on thefull set of faults and multithread processing is applied to the communication of C/S. Agood acceleration rate is achieved. |
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