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X7R弛豫复相铁电陶瓷的研究
引用本文:刘会冲,杨祖培. X7R弛豫复相铁电陶瓷的研究[J]. 电子元件与材料, 2003, 22(9): 15-16,26
作者姓名:刘会冲  杨祖培
作者单位:1. 广东风华高新科技集团有限公司技术中心,广东,肇庆,526020
2. 广东风华高新科技集团有限公司技术中心,广东,肇庆,526020;陕西师范大学化学系,陕西,西安,710062
摘    要:以PZN-BT(低温相)、PMN-PT(高温相)为起始组元,采用混合烧结法制备了具有X7R介电特性电子瓷料,其介电温谱在55~+125℃范围内相当平坦,室温相对介电常数高达3 877,并从离子的键型分析了影响介电温度稳定性的原因,初步探讨了提高介电温度稳定性的机制。

关 键 词:弛豫铁电陶瓷  PZN-BT  PMN-PT  温度稳定性
文章编号:1001-2028(2003)09-0015-02

Study on the X7R Relaxor Ferroelectric Composite Ceramics
LIU Hui-chong ,YANG Zu-pei . Study on the X7R Relaxor Ferroelectric Composite Ceramics[J]. Electronic Components & Materials, 2003, 22(9): 15-16,26
Authors:LIU Hui-chong   YANG Zu-pei
Affiliation:LIU Hui-chong 1,YANG Zu-pei 1,2
Abstract:X7R composite ceramics were prepared by co-sintering PZN-BT (low temperature constituent) and PMN-PT (high temperature constituent). The measurement show that the composite ceramics possess double-phase co-existent structure, and demonstrated large dielectric constant and excellent temperature stability at —55 ~ +125℃. The peak dielectric constant of the room temperature reaches is as high as 3 877. The mechanism of temperature stability improvement is discussed.
Keywords:relaxor ferroelectric ceramics  PZN-BT  PMN-PT  temperature stability
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