Antimony sulfide (Sb2S3) thin films by pulse electrodeposition: Effect of thermal treatment on structural,optical and electrical properties |
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| Affiliation: | 1. Instituto de Energías Renovables, Universidad Nacional Autónoma de México, Temixco, Morelos 62580, México;2. Instituto de Física, BUAP, Av. San Claudio y Blvd. 18 Sur Col. San Manuel, Ciudad Universitaria, C.P. 72570, Puebla, México;3. Departamento de Materiales Nanoestructurados, Centro de Investigación en Materiales Avanzados (CIMAV), Chihuahua, México;1. Wuhan National Laboratory for Optoelectronics (WNLO), Huazhong University of Science and Technology, 1037 Luoyu Road, 430074 Wuhan, Hubei, PR China;2. Department of Materials Science and Engineering, South University of Science and Technology of China, Shenzhen 518055, PR China;1. Unité de Physique des Dispositifs à Semiconduteurs, Faculté des Sciences de Tunis, Tunis El Manar University, Tunisia;2. Laboratoire de Physique des Matériaux, Département de Physique, Faculté des Sciences de Bizerte, Carthage University, 7021 Zarzouna, Tunisia;3. Laboratoire de Chimie Analytique et Electrochimie, Faculté des Sciences de Tunis, Tunis El Manar University, Tunisia;1. Universidad Autónoma de Nuevo León, Facultad de Ingeniería Mecánica y Eléctrica, San Nicolás de los Garza, Nuevo León 66450, Mexico;2. Universidad Autónoma de Nuevo León-CIIDIT, Apodaca, Nuevo León, Mexico;1. Laboratoire de Photovoltaïque (LPV), Centre de Recherches et des Technologies de l’Energie, Technopole Borj Cédria B.P. N° 95, 2050 Hammam-Lif, Tunisia;2. Laboratoire de Photovoltaïque et Matériaux Semi-conducteurs, ENIT-Université Tunis El Manar, BP 37, Le belvédère, 1002 Tunis, Tunisia;3. Institut Préparatoire aux Etudes d’Ingénieurs de Tunis Montfleury, Université de Tunis, Tunisia |
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| Abstract: | Antimony sulfide films have been deposited by pulse electrodeposition on Fluorine doped SnO2 coated glass substrates from aqueous solutions containing SbCl3 and Na2S2O3. The crystalline structure of the films was characterized by X-ray diffraction, Raman spectroscopy and TEM analysis. The deposited films were amorphous and upon annealing in nitrogen/sulfur atmosphere at 250 °C for 30 min, the films started to become crystalline with X-ray diffraction pattern matching that of stibnite, Sb2S3, (JCPDS 6-0474). AFM images revealed that Sb2S3 films have uniformly distributed grains on the surface and the grain agglomeration occurs with annealing. The optical band gap calculated from the transmittance and the reflectance studies were 2.2 and 1.65 eV for as deposited and 300 °C annealed films, respectively. The annealed films were photosensitive and exhibited photo-to-dark current ratio of two orders of magnitude at 1 kW/m2 tungsten halogen radiation. |
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| Keywords: | Thin films Pulse electrodeposition XRD Optical characterization |
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