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3D defect detection of connectors based on structured light
Authors:JIYue  CHEN Yang  SONG Li-mei  YANGYan-gang  YANG Huai-dong
Affiliation:Key Laboratory of Advanced Electrical Engineering and Energy Technology,Tiangong University,Tianjin 300387,China;School of Mechanical Engineering,Tianjin University of Technology and Education,Tianjin 300222,China;Department of Precision Instrument,Tsinghua University,Beijing 100084,China
Abstract:In order to realize the rapid detection of three-dimensional defects of connectors, this paper proposes a method for detecting connector defects based on structured light. This method combines structured light with binocular stereo vision to obtain three-dimensional data for the connector. Point cloud registration is used to identify defects and decision trees are used to classify defects. The accuracy of the 3D reconstruction results in this paper is 0.01 mm, the registration accuracy of the point cloud reaches the sub-millimeter level, and the final defect classification accuracy is 94%. The experimental results prove the effectiveness of the proposed three-dimensional connector defect detection method in connector defect detection and classification.
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