| LTE终端射频测试技术分析 |
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| 引用本文： | 王海燕,于剑飞,石美宪.LTE终端射频测试技术分析[J].电信网技术,2011(2):6-10. |
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| 作者姓名： | 王海燕 于剑飞 石美宪 |
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| 作者单位： | 工业和信息化部电信研究院通信标准研究所工程师; 工业和信息化部电信研究院通信标准研究所高级工程师 |
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| 摘 要： | 作为一项3G向4G演进的主流技术,LTE正赢得全球通信业越来越多的支持,LTE的后续演进得到全球的高度关注,目前LTE终端测试认证也已经开始。本文主要关注LTE终端R8版本的射频测试,介绍了LTE终端射频测试项,分析了LTE终端关键射频测试项,并结合搭建LTE终端射频测试环境对LTE终端射频测试进行了总结。
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| 关 键 词： | LTE 射频 测试 |
Analysis of LTE Terminal RF Testing Tedndogy |
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| Wang Haiyan Yu Jianfei Shi Meixian.Analysis of LTE Terminal RF Testing Tedndogy[J].Telecommunications Network Technology,2011(2):6-10. |
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| Authors: | Wang Haiyan Yu Jianfei Shi Meixian |
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| Affiliation: | Wang Haiyan Yu Jianfei Shi Meixian |
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| Abstract: | As a mainstream technology of the evolution of 3G to 4G.LTE is winning more and more supports of the global communications industry.The follow-up evolution of LTE has got a high attention,and now LTE UE test and certification already have started.This article focuses on the RF test of LTE UE release 8.Introduce the LTE UE RF test cases briefly,and emphasize the analysis of some key LTE RF test cases.Finally,combining with setting up the test environment,we do a summarization of the LTE UE RF test. |
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| Keywords: | LTE RF test |
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