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面向SMT的微焦X射线精密检测技术
引用本文:陈忠,张宪民.面向SMT的微焦X射线精密检测技术[J].机电工程技术,2010,39(2):13-15,58.
作者姓名:陈忠  张宪民
作者单位:华南理工大学机械与汽车工程学院,广东广州,510640
基金项目:粤港关键领域重点突破项目(东莞专项)(编号:2009205200013)
摘    要:面向SMT的的微焦X射线精密检测技术是电子组装工艺缺陷检测的关键技术。着重论述了2.5D微焦X射线设备的构成与原理以及国内外微焦2.5DX射线检测设备的现状.归纳了该类设备的关键技术.并展望了面向SMT的X射线检测技术的发展趋势。

关 键 词:微焦X射线  检测  SMT

Review on Precision Inspection Technique Using Micro-Focus X Ray for SMT
CHEN Zhong,ZHANG Xian-min.Review on Precision Inspection Technique Using Micro-Focus X Ray for SMT[J].Mechanical & Electrical Engineering Technology,2010,39(2):13-15,58.
Authors:CHEN Zhong  ZHANG Xian-min
Affiliation:School of Mechanical & Atuomotive Engineering/a>;South China University of Technology/a>;Guangzhou510640/a>;China
Abstract:The precision inspeciton technique using micro-focus X ray for SMT is critical now and in the future. This paper emphasically introduces the structure and principle of the 2.5D X ray equipment, and presents the status of the 2.5D equipment home and abroad, and the key techniques are resulted. Finally, the paper look forward how the X ray technique in SMT is developping in the future.
Keywords:Micro-focus X ray  inspeciton  SMT  
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