A transmission line technique for measuring the properties of magnetic films |
| |
| Authors: | Siegle W. Woodruff W. |
| |
| Affiliation: | IBM Corporation, Burlington, VT, USA; |
| |
| Abstract: | A novel technique is described to use the magnetic-loading effect of a film on a strip transmission line as a means for measuring the magnetic properties (anisotropy and coercivity) of a thin film. This technique is easy to implement and is particularly useful for film arrays where strip transmission lines are of sufficient length to permit a clear resolution of the film-loading effect. |
| |
| Keywords: | |
|
|
