Numerical analysis on thickness effect of magnetic thin films on conduction noise absorption in microstrip line

Noise absorbing properties of two kinds of magnetic thin films (one is electrically conductive Co-Zr-O granular thin film and the other is Ni-Zn ferrite thin film with high electrical resistivity) are analyzed by the finite element method (FEM) with various film thicknesses. For the Ni-Zn ferrite film with high electrical resistivity (～2 × 10 ² Ωm), a low reflection parameter (S₁₁) value is predicted, and the value does not significantly change with increased film thickness up to 10 μm. However, the transmission parameter (S₂₁) is reduced with increased film thickness due to increased power absorption by magnetic loss. For the Co-Zr-O thin films with low electrical resistivity (～1.6 × 10^?5 Ωm), however, reflection signal is increased with increased film thickness due to diminished sheet resistance of the thin film. Transmission loss is not very sensitive to the thickness of the conductive film. Large power absorption is, therefore, predicted for conductive film of smaller thickness. It is concluded that film thickness is an important control parameter for the achievement of a highly absorptive thin film with increased electrical conductivity.