基于65 nm工艺的多端口可配置PUF电路设计

物理不可克隆函数(Physical Unclonable Function, PUF)电路利用结构完全相同的电路在制造过程中存在的随机工艺偏差，产生具有唯一性、随机性和不可克隆性的密钥。该文通过对共源共栅电流镜的研究，提出一种基于电流镜工艺偏差的多端口可配置PUF电路。该PUF电路由输入寄存器、偏差电压源、复用网络、判决器阵列和扰乱模块构成，通过激励信号配置偏差电压源，无需更换硬件便可实现输出密钥的变化，且可在一个时钟周期内输出多位密钥。在SMIC 65 nm CMOS工艺下，采用全定制方式设计具有36个输出端口的PUF电路，版图面积为24.8 m77.4 m。实验结果表明，该PUF电路具有良好的唯一性和随机性，且工作在不同温度(-40~125C)和电压(1.08~1.32 V)下的可靠性均大于97.4%，可应用于信息安全领域。

Design of Multi-port Configurable PUF Circuit Based on 65 nm Technology

Physical Unclonable Functions (PUF) exploits process variation across the same structure circuits during the manufacturing processes to generate numerous unique, random and unclonable security keys. In this paper, a multi-port configurable PUF scheme is proposed, which is based on random deviation of current mirrors. It consists of input register, deviation-voltage source, multiplexing-net, arbiter array and obfuscation circuit. After configuring deviation-voltage source by applying different input challenges, the PUF circuit updates keys without physically replacement, and it can generate multi-bit keys in a clock cycle. In SMIC 65 nm CMOS technology, the layout of 36 ports configurable PUF occupies 24.8 m77.4 m with custom designing. Experimental results show that the PUF circuit possesses better statistical characteristic of uniqueness and randomness, and it has a high reliability of 97.4% with respect to temperature variation from ?40 C to 125 C, and supply voltage variation from 1.08 V to 1.32 V. It can be effectively used in information security field.