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Specific features of relief formation on silicon etched by a focused ion beam
Authors:N. N. Gerasimenko  A. A. Chamov  N. A. Medetov  V. A. Khanin
Affiliation:1.Moscow State Institute of Electronic Engineering (Technical University),Zelenograd, Moscow,Russia
Abstract:The effect of a focused ion beam on the state of a silicon crystal surface has been studied. Periodic ring-shaped ribs have been observed on the walls of an etched cylindrical hole. The formation of periodic structures depends on the conditions of ion beam etching. The observed phenomenon is explained based on the notion of the radiation-induced plasticity.
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