近红外光谱仪计量检定系统

针对近红外光谱仪难以进行量值溯源的现状,设计了计量检定系统。通过对其结构和工作原理的分析,提出了需要计量受控的技术指标;选用干涉滤光镜和中性滤光镜等器件作为标准,提出了各项技术指标的检定、校准或者测试方法;采用高斯拟合法建立了寻峰数学模型,并基于LabVIEW平台开发了数据分析处理系统。实验结果表明,该系统能够实现近红外光谱仪的计量检定,解决了其量值溯源的难题。

Metrological Verification System of Near Infrared Spectrometer

Aiming at the problem of traceability of near infrared spectrometer, a metrological verification system was designed. The specifications required being controlled by meterage were analyzed after analyzing the structure and principle of fixed-optics near infrared spectrometer. The verification/calibration/testing methods for all specifications were proposed based on selecting interference filter and neutral density filter and other equipments as standard equipments The peak searching mathematical model was established adopting Gaussian fitting method, and a data analysis system was developed based on LabVIEW program. Experimental results showed that this method will achieve metrological verification of near infrared spectrometer, and solve the problem of its traceability