| 逆反射系数测量标准装置的建立 |
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| 引用本文： | 郑春弟,冯国进,梁凤臣,张巧香,吴厚平,刘子龙,甘海勇. 逆反射系数测量标准装置的建立[J]. 计量学报, 2021, 42(1): 16-19. DOI: 10.3969/j.issn.1000-1158.2021.01.03 |
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| 作者姓名： | 郑春弟 冯国进 梁凤臣 张巧香 吴厚平 刘子龙 甘海勇 |
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| 作者单位： | 中国计量科学研究院,北京100029;中国计量科学研究院,北京100029;中国计量科学研究院,北京100029;中国计量科学研究院,北京100029;中国计量科学研究院,北京100029;中国计量科学研究院,北京100029;中国计量科学研究院,北京100029 |
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| 摘 要： | 中国计量科学研究院基于照度法建立了逆反射系数测量标准装置.介绍了该装置的构成和原理;分析了影响测量不确定度水平的主要因素,最终实现测量范围覆盖0.05～1999.00 cd·lx-1.m-2,测量不确定度Urel为3.0％～8.2％,k=2.
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| 关 键 词： | 计量学 逆反射系数 标准装置 照度法 不确定度 |
| 收稿时间： | 2019-09-05 |
Establishment on Standard Device for Measuring Retroreflection Coefficient |
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| ZHENG Chun-di,FENG Guo-jin,LIANG Feng-chen,ZHANG Qiao-xiang,WU Hou-ping,LIU Zi-long,GAN Hai-yong. Establishment on Standard Device for Measuring Retroreflection Coefficient[J]. Acta Metrologica Sinica, 2021, 42(1): 16-19. DOI: 10.3969/j.issn.1000-1158.2021.01.03 |
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| Authors: | ZHENG Chun-di FENG Guo-jin LIANG Feng-chen ZHANG Qiao-xiang WU Hou-ping LIU Zi-long GAN Hai-yong |
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| Affiliation: | National Institute of Metrology, Beijing 100029, China |
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| Abstract: | Based on the illuminance method,a standard device for measuring the coefficient of retroreflection has been established in National Institute of Metrology. The structure and principle of the device are described in detail,and the main factors affecting the level of uncertainty of measurement are analyzed. The final measurement range covers 0. 05 ~1 999. 00 cd·lx-1·m-2. The measurement uncertainty Urelis 3. 0% ~ 8. 2%,k = 2. |
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| Keywords: | metrology retroreflection coefficient standard device illuminance method uncertainty |
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