首页 | 本学科首页   官方微博 | 高级检索  
     

基于FPGA+ADSP的线阵CCD非接触测量系统
引用本文:葛鹏,刘涛,李奇. 基于FPGA+ADSP的线阵CCD非接触测量系统[J]. 光学仪器, 2008, 30(5): 1-4
作者姓名:葛鹏  刘涛  李奇
作者单位:浙江大学,现代光学仪器国家重点实验室,浙江,杭州,310027;中国计量学院,光学与电子科技学院,浙江,杭州,310034
摘    要:提出了基于FPGA和ADSP的线阵CCD非接触测量技术。选用线阵CCD作为前端信号采集;采用FPGA产生与控制整个系统的时序:CCD工作时序、A/D转换时序、ADSP采集数据同步时序;采用多次扫描平均方法形成一维数字图像;利用DSP高速图像处理性能并设计高性能的浮动阈值二值化算法对其处理。给出了时序仿真图,满足系统的时序要求;并给出了测量物体的波形。通过对光学系统的定标最终给出了物体的长度。数据表明,相比传统的测量系统,该系统具有高速和高精度的优点。

关 键 词:光学测量  线阵CCD  FPGA  ADSP  多行扫描

A non-contact linear CCD measuring system based on FPGA and ADSP
GE Peng,LIU Tao,LI Qi. A non-contact linear CCD measuring system based on FPGA and ADSP[J]. Optical Instruments, 2008, 30(5): 1-4
Authors:GE Peng  LIU Tao  LI Qi
Abstract:A non-contact linear CCD measuring system based on FPGA and ADSP technology is proposed.The system utilizes linear CCD as the signal acquisition frontend.FPGA provides time sequences such as CCD working sequences,A/D conversion timing and synchronized timing for ADSP to collect data.Multiple sampling and averaging methods are used to produce one-dimensional digital photographs in virtue of DSP′s high-speed performance and high-performance of float threshold binaryzation algorithms.The simulation timing chart,and the signal′s oscillograph trace of the survey object are given out.The simulation timing satisfies system′s need.Finally through the calibration for the optical system the object′s length is achieved.The experimental data indicates that the measuring system has high speed and high precision performance.
Keywords:FPGA  ADSP
本文献已被 维普 万方数据 等数据库收录!
点击此处可从《光学仪器》浏览原始摘要信息
点击此处可从《光学仪器》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号