Kinetic electron emission yield induced by H and He ions versus stopping power for Al, Cu, Ag and Au

For H⁺ and He²⁺ ions impinging on Al, Cu, Ag and Au targets we measured simultaneously the yield, γ, of emitted electrons and the electronic energy loss, S_e, in the energy range 0.5 to 4.8 MeV. The targets were prepared under high-vacuum conditions before they were transferred to an ultra-high-vacuum chamber without breaking the vacuum. The targets were sputter cleaned and their composition was examined by Auger electron spectrometry. The values of γ were obtained by current integration and S_e was determined from the energy width of Rutherford backscattering spectra. For H⁺ ions impinging on Cu, Ag or Au and He²⁺ on Al and Cu, the expected proportionality between γ and S_e was found within the experimental errors of 2%. For H⁺ ions on Al and He²⁺ ions on Ag and Au targets, significant deviations were observed.