Effects of Cu,Bi, and In on microstructure and tensile properties of Sn-Ag-X(Cu,Bi, In) solders |
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Authors: | M L Huang L Wang |
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Affiliation: | (1) the Department of Materials Science and Engineering, Dalian University of Technology, 116024 Dalian, People’s Republic of China |
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Abstract: | Effects of minor additions of Cu, Bi, and In on microstructure, melting temperature, and tensile properties of Sn-Ag-based
lead-free solders were investigated. It was found that the intermetallic compounds (IMCs) Ag2In and Cu6Sn5 are formed in In- and Cu-containing solders, respectively. At low concentration, Bi dissolved in the Sn matrix and tended
to precipitate pure Bi particles at the solubility limit of 4 wt pct Bi. The formation of large Ag3Sn precipitates from the solder matrix was suppressed when alloying bismuth into the Sn-Ag alloy. The Bi addition resulted
in a significant linear increase of the ultimate tensile strength (UTS) of solders, which is attributed to a solid-solution
hardening mechanism. Solder strengthening due to In and Cu is less pronounced and attributed to a dispersion strengthening
mechanism. The additions of Cu, Bi, and In all depressed the melting temperatures of Sn-Ag-based solders; however, In is the
most effective one. |
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