| PLZT铁电薄膜的物理特性研究 |
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| 引用本文： | 陈篮,李辉遒,张曰理. PLZT铁电薄膜的物理特性研究[J]. 功能材料, 2000, 31(3): 287-290 |
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| 作者姓名： | 陈篮 李辉遒 张曰理 |
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| 作者单位： | 解放军广州通信学院基础教研室!广东广州510502(陈篮)，中山大学物理系!广东广州510275(李辉遒，张曰理，莫党) |
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| 摘 要： | 铁电薄膜是近几年人们关注的功能材料。本文对用溶胶－凝胶技术制备的ＰＬＺＴ铁电薄膜从热处理工艺、Ｘ射线结构分析、ＦＴ－ＩＲ红外光谱等各个方面作了较为系统的研究。讨论了ＰＬＺＴ铁电薄膜的热处理工艺条件，结构特性、光谱特性与材料的表观裂纹、晶态与非晶态之间的关系。对红外光谱的特征吸收峰作了指认，得到了一系列有意义的结果。
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| 关 键 词： | PLZT铁电薄膜 热处理 X射线衍射 FT－IR红外光谱 |
| 文章编号： | 1001-9731(2000)03-0287-03 |
| 修稿时间： | 1999-03-29 |
A Study on the Physical Properties of PLZT Ferroelectric Thin Films |
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| CHEN Lan ,LI Huiqiu ,ZHANG Yueli ,MO Dang. A Study on the Physical Properties of PLZT Ferroelectric Thin Films[J]. Journal of Functional Materials, 2000, 31(3): 287-290 |
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| Authors: | CHEN Lan LI Huiqiu ZHANG Yueli MO Dang |
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| Affiliation: | CHEN Lan(Fundational Department,The PLA Guangzhou Communication Institute,Guangzhou,510502,China)LI Huiqiu,ZHANG Yueli,MO Dang(Department of Physics,Zhongshan University,Guangzhou,510275,China) |
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| Abstract: | In recent years,lead-based ferroelectrics thin films have gained much attention as attractive materials.In this work,we report our experimental results of systematic study of sol-gel processing PLZT thin films using X-ray diffraction,Fourier transform infrared (FT-IR) spectroscopy etc.We also discuss in detail the relation between heat treatment technology,phase structures,optical spectroscopic properties with apparent crackle,crystalline state and amorphous state etc.The PLZT thin films are characterized by FT-IR.Lastly,a series of significant conclusions are given. |
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| Keywords: | PLZT ferroelectric thin films heat treatment X-ray diffraction fourier transform infrared (FT-IR) spectroscopy |
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