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Reflection of Plane Waves in a Semiconducting Medium under Photothermal Theory |
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| Authors: | Y Q Song J T Bai Z Y Ren |
| Affiliation: | 1. State Key Laboratory for Strength and Vibration of Mechanical Structures, School of Aerospace, Xi’an Jiaotong University, Shaanxi, 710049, People’s Republic of China 2. National Key Laboratory of Photoelectric Technology and Functional Materials (Culture Base) and Shaanxi Provincial Key Laboratory of Photoelectronic Technology, Northwest University, Shaanxi, 710069, People’s Republic of China 3. State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology, Dalian, 116023, People’s Republic of China |
| Abstract: | In this paper photothermal theory was used to study the reflection of waves at the surface of a semi-infinite semiconconducting medium. Using the harmonic wave method, the reflection coefficient ratios were obtained analytically under coupled thermoelastic theory and plasma theory for an incident CI wave, which is one coupled thermoelastic plasma wave and an incident rotational wave. The variations of the amplitude of reflection coefficient ratios with the angle of incidence are shown graphically for silicon. Effects of the thermal frequency, the thermoelastic coupling parameter, and the thermoelectric coupling parameter were given by numerical results. Also, the energy ratios for reflected waves were computed to check the numerical results. |
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