空基紫外成像仪关键器件ICCD非均匀性校正技术

从理论上分析了ICCD光电响应非均匀性的产生机理,并由此建立光电响应数学模型。基于两点多段非均匀性校正算法给出了ICCD非均匀性校正方程,并通过大量实验得到ICCD在特定条件下的校正系数。在实验过程中发现ICCD的雪花点(主要由探测器的随机噪声引起)和盲点是影响非均匀性改善的主要因素,采取相应照度的响应进行了补偿。结果表明:通过补偿和校正输出图像,可以有效地减小紫外成像仪由探测器的非均匀性所带来的测量误差,使非均匀性降低了37.1%,在一定程度上减少了由于ICCD的物理特性和制造缺陷所带来的固有图像噪声。

Non-uniformity correction of key device ICCD in ultraviolet imager

The mechanism of optoelectronic non-uniformity characteristic in Image Intensified Charge Coupled Device(ICCD) was analyzed, and then a response characteristic mathematic model was proposed. Base on the two-point multi-section method, a non-uniformity equation of ICCD in ultraviolet imager was given and correction coefficients were obtained in specific experiment condition. In the experiments, it is found that the "snow like flicker" (mainly composed of the shot noises of detector) and blind pixels are the main factors of the non-uniformity improvement,which can be compensated by the response values under corresponding illumination. The results show that the compensated and corrected image has effectively reduced the measurement error brought by non-uniformity of the detector and the uniformity decreases by 37.1%. Proposed method and experiment can reduce the intrinsic pattern noise brought by the physical characteristics of ICCD and fabrication defects in certain degree.