| 电子元器件测试系统选型方法 |
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| 引用本文： | 孙铣.电子元器件测试系统选型方法[J].电子质量,2005(3):13-18. |
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| 作者姓名： | 孙铣 |
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| 作者单位： | 北京华峰测控技术有限公司,北京,100039 |
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| 摘 要： | 文章分析了我国整机企业的元器件测试需求和"小而全"测试体制,以及整机企业在测试系统选型中的一些认识和倾向,比较,分析了选择国产测试系统和进口测试系统,选择中、小型测试系统和大型测试系统的利弊,并对测试系统的选型和评价提出了看法.
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| 关 键 词： | 元器件测试系统 系统选型 测试体制 测试技术 |
| 文章编号： | 1003-0107(2005)03-0013-06 |
The lectotype Method for the Test System of Electronic Components |
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| Sun Xian.The lectotype Method for the Test System of Electronic Components[J].Electronics Quality,2005(3):13-18. |
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| Authors: | Sun Xian |
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| Abstract: | The paper analyzed the demand of the component test and the "Compact and Comprehensive" test system, andthe introduced some knowledge and tendency in the selection of test system. And then the author illustrated the advantagesand defects in the selection from medium and small to the large-scale test system through the comparison and analysis ofdomestic and imported test system, put forward the suggestion in the evaluation and lectotype of test system. |
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| Keywords: | Component test system Lectotype for the system Test system Test technology |
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