| S—570扫描电镜故障排除二例 |
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| 引用本文： | 张良平 付建华. S—570扫描电镜故障排除二例[J]. 电子显微学报, 1992, 11(3): 235-238 |
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| 作者姓名： | 张良平 付建华 |
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| 作者单位： | 湖南师大电镜室，湖南师大电镜室 |
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| 摘 要： | 本文总结了日立S-570扫描电镜颇为严重故障的检查与排除两例,它对于电镜使用人员和电镜维修工作者,将提供有益的帮助。
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| 关 键 词： | 扫描电镜 故障 维修 S－570型 |
Two Examples of(Recovery processing)on Hitachi S-570 Scanning Electron Microscope |
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| Zhang Lianping Fu Jianhua. Two Examples of(Recovery processing)on Hitachi S-570 Scanning Electron Microscope[J]. Journal of Chinese Electron Microscopy Society, 1992, 11(3): 235-238 |
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| Authors: | Zhang Lianping Fu Jianhua |
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| Abstract: | This paper presents two example of truble shooting and recovery processing on S-570 Scanning Electeron Microscope. It would provide effective help for the engineers who work at electron Microscope. |
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| Keywords: | Scanning Electron Microscope Elimination Trouble |
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