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Design of the coarse-grained reconfigurable architecture DART with on-line error detection
Authors:SMAH Jafri  SJ Piestrak  O Sentieys  S Pillement
Affiliation:1. Electronic Systems Lab., Royal Institute of Technology (KTH), SE-10044 Stockholm, Sweden;2. Institut Jean Lamour, UMR CNRS 7198, Université de Lorraine, 54506 Vandoeuvre-lès-Nancy, France;3. University of Rennes, 1/IRISA/INRIA, CAIRN Res. Team, 6 rue de Kérampont, F-22300 Lannion, France;4. École Polytechnique de l’Université de Nantes, Département Électronique et Technologies Numériques, 44306 Nantes, France
Abstract:This paper presents the implementation of the coarse-grained reconfigurable architecture (CGRA) DART with on-line error detection intended for increasing fault-tolerance. Most parts of the data paths and of the local memory of DART are protected using residue code modulo 3, whereas only the logic unit is protected using duplication with comparison. These low-cost hardware techniques would allow to tolerate temporary faults (including so called soft errors caused by radiation), provided that some technique based on re-execution of the last operation is used. Synthesis results obtained for a 90 nm CMOS technology have confirmed significant hardware and power consumption savings of the proposed approach over commonly used duplication with comparison. Introducing one extra pipeline stage in the self-checking version of the basic arithmetic blocks has allowed to significantly reduce the delay overhead compared to our previous design.
Keywords:Coarse-grained reconfigurable architecture (CGRA)  Fault-tolerant system  Reconfigurable system  On-line error detection  Self-checking circuit  Residue code  Arithmetic code  Temporary faults
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