| 合成控制图 |
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| 引用本文： | 吴海英. 合成控制图[J]. 武汉理工大学学报, 2004, 26(12): 96-98 |
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| 作者姓名： | 吴海英 |
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| 作者单位： | 武汉理工大学理学院,武汉,430070 |
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| 摘 要： | 质量管理中广泛使用的休哈特X控制图，对发现工序均值大偏移有效，但对小偏移却不敏感，np控制图情况类似。现提出2种合成控制图：合成X-CRL控制图与合成np-CRL控制图。结果发现工序小到中等变化的平均链长大约只有普通X控制图与np控制图的一半，明显地优于Cusum控制图和EWMA控制图。
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| 关 键 词： | 工序控制 几何分布 ARL |
| 文章编号： | 1671-4431(2004)12-0096-03 |
| 修稿时间： | 2004-07-11 |
Synthetic Control Charts |
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| WU Hai-ying. Synthetic Control Charts[J]. Journal of Wuhan University of Technology, 2004, 26(12): 96-98 |
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| Authors: | WU Hai-ying |
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| Abstract: | In quality control, Shewhart control charts are widely used because they are efficient for large mean shift. But for small or moderate mean shift, they are less sensitive. Similar phenomenon occurs in np control charts. This research proposed two synthetic control charts: a synthetic -CRL control chart and a synthetic np-CRL control chart. The synthetic control charts consistently produced shorter out-of-control average run lengths than the charts and the np charts by nearly half for small or moderate shift. They are better than Cusum control chart and EWMA control chart. |
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| Keywords: | process control geometrical distribution ARL |
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