| 专用集成电路CAT技术的进展 |
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| 引用本文： | 林争辉,秦建业.专用集成电路CAT技术的进展[J].微电子学,1992,22(4):14-22. |
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| 作者姓名： | 林争辉 秦建业 |
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| 作者单位： | 上海交通大学LSI研究所，上海交通大学LSI研究所，上海交通大学LSI研究所 上海 200030，上海 200030，上海 200030 |
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| 摘 要： | 本文简单地回顾了提高VLSI测试效率所采用的一些手段,讨论了在ASIC测试问题研究中出现的一些新观点、新方法、新动向,以及所取得的成果。在此基础上,文章阐明了ASIC测试技术的发展方向,并着重论述了可望在未来得到发展的,针对ASIC的功能测试方法。
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| 关 键 词： | ASIC 功能测试 专用集成电路 CAD |
Advances in Computer-Aided Testing of ASIC's |
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| Lin Zhenghui,Qin Jianye and Liu Zejian VLSI Institute,Shanghai Jiaotong University,Shanghai.Advances in Computer-Aided Testing of ASIC''''s[J].Microelectronics,1992,22(4):14-22. |
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| Authors: | Lin Zhenghui Qin Jianye and Liu Zejian VLSI Institute Shanghai Jiaotong University Shanghai |
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| Affiliation: | Lin Zhenghui,Qin Jianye and Liu Zejian VLSI Institute,Shanghai Jiaotong University,200030,Shanghai |
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| Abstract: | Ways to improve VLSI test efficiency are viewed. New concepts, new methods and new trends emerging in the field of ASIC test as well as the achievements are described. An explanation is given on the orientation of the development of ASIC test, with emphasis on the functional test methods for ASICs that show great promise. |
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| Keywords: | ASIC Functional test CAT |
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