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Critical parameters of percolation in metal-dielectric diamond-like composites of atomic scale
Authors:B.F. Dorfman
Affiliation:

Atomic-Scale Design, Inc., P.O. Box 210 483, San Francisco, CA 94121, USA

Abstract:The stabilized atomic scale composites ‘diamond-like carbon-metal’ are virtually ideal metal-dielectric percolating systems. The metals may be introduced in the diamond-like dielectric during its growth in a combined plasma and molecular beam deposition process. The maximum metal concentration and temperature limiting the composite stability depend on the atom radius and metal-matrix interaction. The percolation threshold in ([Cr,Fe,Ni]-C) composites corresponds to the theoretical value Xc=0.25 with critical exponent t=1.44, while in (W–C), (Hf–C), (Nb–C) composites the critical parameters of percolation are Xc=0.10, 1.25≤t≤2.0. A possible reason for this giant shift of percolation threshold is a self-organized redistribution of relatively large metallic atoms.
Keywords:Amorphous films   Percolation (solid state)   Carbon   Electric conductivity of solids   Phase transitions   Plasma applications   Molecular beams   Plasma deposition process   Molecular beam deposition process
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