Critical parameters of percolation in metal-dielectric diamond-like composites of atomic scale |
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Authors: | B.F. Dorfman |
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Affiliation: | Atomic-Scale Design, Inc., P.O. Box 210 483, San Francisco, CA 94121, USA |
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Abstract: | The stabilized atomic scale composites ‘diamond-like carbon-metal’ are virtually ideal metal-dielectric percolating systems. The metals may be introduced in the diamond-like dielectric during its growth in a combined plasma and molecular beam deposition process. The maximum metal concentration and temperature limiting the composite stability depend on the atom radius and metal-matrix interaction. The percolation threshold in ([Cr,Fe,Ni]-C) composites corresponds to the theoretical value Xc=0.25 with critical exponent t=1.44, while in (W–C), (Hf–C), (Nb–C) composites the critical parameters of percolation are Xc=0.10, 1.25≤t≤2.0. A possible reason for this giant shift of percolation threshold is a self-organized redistribution of relatively large metallic atoms. |
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Keywords: | Amorphous films Percolation (solid state) Carbon Electric conductivity of solids Phase transitions Plasma applications Molecular beams Plasma deposition process Molecular beam deposition process |
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