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MEMS加速度计在振动环境下的可靠性分析
引用本文:李明珠,许高斌,董娜娜,袁婷,马渊明,冯建国. MEMS加速度计在振动环境下的可靠性分析[J]. 半导体光电, 2022, 43(6): 1055-1061
作者姓名:李明珠  许高斌  董娜娜  袁婷  马渊明  冯建国
作者单位:合肥工业大学 微电子学院 安徽省微电子机械系统工程技术研究中心, 合肥 230009
基金项目:国家重点研发计划项目(2020YFB2008901);安徽省发改委研发创新项目(JZ2021AFKJ0050);安徽省工程技术研究中心项目(PA2022AKGY0012);中央高校基本科研业务费专项项目(JZ2021HGQA0254,JZ2021HGTA0147).*通信作者:许高斌E-mail:gbxu@hfut.edu.cn
摘    要:以电容式MEMS加速度计的悬臂梁结构为研究对象,分析了振动环境下MEMS加速度计的典型失效模式及失效机理;在Miner理论的基础上,引入了应力-寿命曲线,建立了疲劳可靠性模型;在考虑强度退化前提下,基于应力强度干涉理论建立了塑性形变可靠性模型;运用蒙特卡洛法验证了两种可靠性模型的准确性,并分析了模型关键参数对可靠度的影响。结果显示,振动应力水平和材料的屈服强度对可靠度有显著的影响,减小应力幅值,增大屈服强度,可以提高MEMS加速度计的可靠性。

关 键 词:MEMS加速度计  悬臂梁  疲劳失效  塑性形变  蒙特卡洛法  可靠性
收稿时间:2022-09-08

Reliability Analysis of MEMS Accelerometer in Vibration Environment
LI Mingzhu,XU Gaobin,DONG Nan,YUAN Ting,MA Yuanming,FENG Jianguo. Reliability Analysis of MEMS Accelerometer in Vibration Environment[J]. Semiconductor Optoelectronics, 2022, 43(6): 1055-1061
Authors:LI Mingzhu  XU Gaobin  DONG Nan  YUAN Ting  MA Yuanming  FENG Jianguo
Affiliation:Micro Electromechanical System Research Center of Engineering and Technology of Anhui Province, School of Microelectronics, Hefei University of Technology, Hefei 230009, CHN
Abstract:Taking the cantilever structure of capacitive MEMS accelerometer as the research object, the typical failure mode and failure mechanism of MEMS accelerometer in vibration environment were analyzed. Based on Miner''s theory, the stress-life curve was introduced to establish the fatigue reliability model. The reliability model of plastic deformation was established based on stress intensity interference theory considering strength degradation. The Monte Carlo method was used to verify the accuracy of the two reliability models, and the influence of the key parameters of the model on the reliability was analyzed. The results show that the vibration stress level and the yield strength of the material had significant influence on the reliability. Reducing the stress amplitude and increasing the yield strength can improve the reliability of the MEMS accelerometer.
Keywords:MEMS accelerometer   cantilever   fatigue failure   plastic deformation   Monte Carlo   reliability
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