A genetic algorithm based method for source identification andfar-field radiated emissions prediction from near-field measurements forPCB characterization

A new method for predicting the far-field radiated emissions and for finding the radiation sources of a device from near-field measurements is presented. It is based on the substitution of the original device by an equivalent set of elemental dipoles, placed over the main radiating sources, which radiate the same near-field (and therefore, far-field). This equivalent set of elemental dipoles is generated using a genetic algorithm. From the position and type of the equivalent elemental dipoles, the position of the actual radiating sources is determined. Since the field produced by an elemental dipole is known, the far-field radiation of the actual radiating source can be calculated. The new method has been tested using synthetic data and real measurements from the radiation generated by a modem PCB demonstrating its viability and usefulness