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Intrinsic stability of an HBT based on a small signal equivalent circuit model
Authors:Chen Yanhu  Shen Huajun  Liu Xinyu  Li Huijun  Xu Hui  Li Ling
Affiliation:1. School of Information Science and Engineering, Shandong University, Jinan 250100,China
2. Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029,China
Abstract:Intrinsic stability of the heterojunction bipolar transistor (HBT) was analyzed and discussed based on a small signal equivalent circuit model.The stability factor of the HBT device was derived based on a compact T-type small signal equivalent circuit model of the HBT.The effect of the mainly small signal model parameters of the HBT on the stability of the HBT was thoroughly examined.The discipline of parameter optimum to improve the intrinsic stability of the HBT was achieved.The theoretic analysis results of the stability were also used to explain the experimental results of the stability of the HBT and they were verified by the experimental results.
Keywords:HBT  intrinsic stability  stability factor  small signal equivalent circuit model
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