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An asymmetrical sensing scheme for 1T1C FRAM to increase the sense margin
Jia Ze, Zou Zhongren, Ren Tianling, Chen Hongyi. An asymmetrical sensing scheme for 1T1C FRAM to increase the sense margin[J]. Journal of Semiconductors, 2010, 31(11): 115001. doi: 10.1088/1674-4926/31/11/115001 Jia Z, Zou Z R, Ren T L, Chen H Y. An asymmetrical sensing scheme for 1T1C FRAM to increase the sense margin[J]. J. Semicond., 2010, 31(11): 115001. doi: 10.1088/1674-4926/31/11/115001.Export: BibTex EndNote
Authors:Jia Ze  Zou Zhongren  Ren Tianling  Chen Hongyi
Affiliation:Tsinghua National Laboratory for Information Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing 100084, China;Tsinghua National Laboratory for Information Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing 100084, China;Tsinghua National Laboratory for Information Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing 100084, China;Tsinghua National Laboratory for Information Science and Technology, Institute of Microelectronics, Tsinghua University, Beijing 100084, China
Abstract:A novel asymmetrical current-based sensing scheme for 1T1C FRAM is proposed, in which the two input transistors are not the same size and a feedback NMOS is added at the reference side of the sense amplifier. Compared with the conventional symmetrical scheme in Ref. [8], the proposed scheme increases the sense margin of the readout current by 53.9% and decreases the sensing power consumption by 14.1%, at the cost of an additional 7.89% area of the sensing scheme. An experimental FRAM prototype utilizing the proposed asymmetrical scheme is implemented in a 0.35μm three metal process, in which the function of the prototype is verified.
Keywords:FRAM  sense margin  current-based sense amplmer  asymmetrical
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