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智能卡性能检测方法研究
引用本文:吴舜娟,尹文化,冯志新,陈燕. 智能卡性能检测方法研究[J]. 合成材料老化与应用, 2014, 0(2): 60-63
作者姓名:吴舜娟  尹文化  冯志新  陈燕
作者单位:广州合成材料研究院有限公司,广东广州000000
摘    要:简单概述了智能卡标准的测试方法,并讨论智能卡在现有复杂环境中,其使用寿命及理化性能检测方法。从智能卡的实际应用和新技术发展趋势考虑,建议开展标准检测方法以外的新检测项目。

关 键 词:智能卡  检测方法  趋势  新检测项目

Study on Performance Test Methods for Smart Cards
WU Shun-juan,YIN Wen-hua,FENG Zhi-xin,CHEN Yan. Study on Performance Test Methods for Smart Cards[J]. Synthetic Materials Aging and Application, 2014, 0(2): 60-63
Authors:WU Shun-juan  YIN Wen-hua  FENG Zhi-xin  CHEN Yan
Affiliation:( Guangzhou Research Institute Co. Ltd. of Synthetic Materials, Guangzhou 510665, Guangdong, China)
Abstract:The Smart Card Standard test methods was briefly outlined, and the detection methods of the smart card's service life and physical and chemical properties were discussed in the complex existing environment. Considering the practical application of the smart cards and the new technology trends, it is recommended to carry out a new test items besides the standard testing methods.
Keywords:smart card   testing methods   trends   new test items
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