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The interferometric mirage effect method: The determination of the thermal diffusivity of CdMnTe |
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| Authors: | E. Corona-Organiche,C. Vá zquez-Ló pez,Juan E. Morales |
| Affiliation: | a Centro de Investigación en Ciencia Aplicaday Tecnología Avanzada del I.P.N. Unidad Puebla, Mexico b Instituto de Física, Universidad Autónoma de Puebla, Apartado Postal J-48, Puebla 72570, Pue. Mexico c Departamento de Física, Centro de Investigación y de Estudios Avanzados del I.P.N. Apdo. Postal 14-740, Mexico, DF 07360, Mexico d Departamento de Física, Universidad de Concepción, Casilla 160-C, Concepción, Chile |
| Abstract: | A Michelson interferometer was used as a precise detector in the Mirage effect configuration in order to determine the thermal diffusivity of the diluted magnetic semiconductor Cd1−xMnxTe, in the concentration range 0<x<0.6 at room temperature. This zinc-blende ternary alloy exhibits an almost linear behavior of the thermal diffusivity as a function of Mn concentration. This trend is similar to that of the energy gap against Mn concentration, which increases linearly as the nominal x value increases. The latter result was tested by electrolytic electroreflectance measurements. |
| Keywords: | Interferometric thermal instrument Thermal diffusivity CdMnTe semiconductor Mirage effect |
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