| 特征X射线能谱法测定Fe^＋注入小麦种子的深度 |
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| 引用本文： | 颉红梅,卫增泉.特征X射线能谱法测定Fe^＋注入小麦种子的深度[J].核技术,1997,20(2):105-108. |
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| 作者姓名： | 颉红梅 卫增泉 |
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| 作者单位： | 中国科学院近代物理研究所 |
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| 摘 要： | 用１１０ｋｅＶ Ｆｅ＾＋离子束垂直注入小麦种胚后，在扫描电子显微镜上沿种子纵沟剖面，在不同深度上测量Ｆｅ元素被激发出的特征Ｘ射线强度分布，结果表明分布呈指数衰减，与晶体中的热扩散分布相类似，并对此进行了讨论。
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| 关 键 词： | 小麦 离子注入 扫描电镜 小麦种子 辐射育种 |
Depth determination of Fe +ions implanted into wheat seeds using characteristic X-ray spectrum method |
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| Xie Hongmei,Wei Zengquan,Li Wenjian.Depth determination of Fe +ions implanted into wheat seeds using characteristic X-ray spectrum method[J].Nuclear Techniques,1997,20(2):105-108. |
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| Authors: | Xie Hongmei Wei Zengquan Li Wenjian |
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| Abstract: | The intensity distribution of characteristic X-rays from Fe element at different depths of embryo of a wheat seed implanted vertically by 110keV Fe +ions was measured in SEM along the longitudinal channel section. It was shown that the distribution was of exponential decrease similar to the case of thermal diffusion in crystals. |
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| Keywords: | Wheat Ion implantation SEM X-ray spectrum analysis |
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