| 一种微处理器芯片的验证测试分析及应用 |
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| 引用本文： | 檀彦卓,韩银和,李晓维. 一种微处理器芯片的验证测试分析及应用[J]. 计算机工程, 2006, 32(9): 219-221 |
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| 作者姓名： | 檀彦卓 韩银和 李晓维 |
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| 作者单位： | 1. 中国科学院计算技术研究所,北京,100080;中国科学院研究生院,北京,100039
2. 中国科学院计算技术研究所,北京,100080 |
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| 基金项目： | 中国科学院资助项目;北京市科技重点基金 |
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| 摘 要： | 验证测试技术是验证芯片设计正确与否的重要环节，不仅向设计者及时反馈了有效的信息以尽早发现错误、改进设计，并能为降低测试成本和生产测试提供有效保障。基于实际工程，该文提出了一个较有效的验证分析流程方案，采用多测试项目融合曲测试法对一款微处理器芯片进行了验证分析，并对相关测试项目进行了定量、定性的评估。
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| 关 键 词： | 验证测试 生产测试 失效分析 可测试性设计 故障模型 |
| 文章编号： | 1000-3428（2006）09-0219-03 |
| 收稿时间： | 2005-05-25 |
| 修稿时间： | 2005-05-25 |
Verification Test Analysis and Application for a Microprocessor Chip |
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| TAN Yanzhuo,HAN Yinhe,LI Xiaowei. Verification Test Analysis and Application for a Microprocessor Chip[J]. Computer Engineering, 2006, 32(9): 219-221 |
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| Authors: | TAN Yanzhuo HAN Yinhe LI Xiaowei |
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| Affiliation: | 1. Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100080; 2. Graduate School of Chinese Academy of Sciences, Beijing 100039 |
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| Abstract: | The verification test technique plays a key role in checking the correctness of the IC design. It can not only return the effective data in time to finding the errors and improve the design as soon as possible, but also provide a cost-effective way to reduce the test cost and ease the later manufacture test. Based on an actual engineering project, this paper proposes a better verification test flow. By integrating multiple test methods into this flow, this paper verifies a type of microprocessor chip and gives the quantitative and qualitative analysis for the related test projects. |
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| Keywords: | Verification test Manufacture test Failure analysis Design for testability(DFT) Fault model |
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