单粒子四点翻转自恢复加固锁存器设计

为了容忍日益严重的单粒子多点翻转,提出了一种能够容忍单粒子四点翻转的加固锁存器——QNURL(quadruple node upset recovery latch).该锁存器包含40个同构的双输入反相器,形成5×8的阵列结构,构建了多级过滤的容错机制.通过有效地利用双输入反相器的单粒子过滤特性,当任意4个内部状态节点同时发生翻转时,都可以被多级过滤机制消除,自动恢复到正确值. PTM 32 nm工艺下的仿真结果表明,与现有的4种单粒子多点翻转加固锁存器综合比较,该锁存器的单粒子四点翻转自恢复比率高达100%,延迟平均降低了86.02%,功耗延迟积(powerdelayproduct,PDP)平均降低了78.94%,功耗平均增加了59.09%,面积平均增加了4.63%.文章最后对结构进行了衍生,提出了容忍N点翻转的(N (10)1)'2N结构框架.

Single-Event Quadruple-Upset Self-Recoverable Latch Design

For the sake of the requirement to tolerate increasingly serious single event multimode upset,a kind of radiation hardened latch which can tolerate single event quadruple node upset:QNURL(quadruple node upset recovery latch)is proposed.The QNURL consists of 40 isomorphic dual-input inverters,forming a 5×8 array structure,and constructing a fault-tolerant mechanism of multi-level filtering.The single-particle filtering characteristics of the dual input inverter are effectively utilized.When any 4 internal state nodes upset at the same time,they can be eliminated by the multi-level filtering mechanism and automatically restored to the correct value.The experimental results under the PTM 32 nm process show that compared with the existing four kinds of single event multimode up set radiation hardened latches,the single event quadruple node up set self recovery rate of the QNURL is as high as 100%,and the average delay is reduced by 86.02%.The average power delay product(PDP)is reduced by 78.94%.The average power consumption is increased by 59.09%,and the average area is increased by 4.63%.In this paper,the structure(N+1)×2N is derived,and also proposed a structure framework which can tolerant N-nodes upset.