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探针组分对紫外光固化材料表面性能的影响
引用本文:王德海,骆燕,蔡延庆. 探针组分对紫外光固化材料表面性能的影响[J]. 辐射研究与辐射工艺学报, 2006, 24(4): 214-218
作者姓名:王德海  骆燕  蔡延庆
作者单位:浙江工业大学化学工程与材料学院,杭州,310014
摘    要:光固化快速成型技术(Stereolithography,SL)采用材料逐层固化累加法来形成三维实体模型,因此固化材料的表面性质对层与层之间的结合力有着非常大的影响。为了研究环氧丙烯酸酯类紫外光固化材料所形成表面的性质及影响因素,通过使用探针组分,对固化涂层进行接触角的测定和表面能的计算,并用衰减全反射-傅立叶变换红外光谱(Attenuated total reflectance-Fourier transforminfrared,ATR-FTIR)对固化膜的表面组成进行了表征。结果表明:固化过程中组分发生了迁移,其含量由表及里存在分布不均现象,最终对固化层的表面能产生了影响,且质量分数为0.01%的探针组分含量就能使表面能的变化显得相当敏感(Deuchem 467使涂层表面能由51.32mJ m^-2骤降至35.05mJm^2).不同结构的探针组分迁移程度有差异,使涂层表面能发生了不同的改变。同时,组分的迁移程度也与涂层的两种接触介质(固化气氛与基材)的性质有关,引起涂层气氛面和基材面表面能的较大差异。

关 键 词:涂层  表面能  探针组分  迁移  衰减全反射-傅立叶变换红外光谱
收稿时间:2006-01-17
修稿时间:2006-04-21

Effect of the probe components on the surface properties of the UV cured materials
WANG Dehai,LUO Yan,CAI Yanqing. Effect of the probe components on the surface properties of the UV cured materials[J]. Journal of Radiation Research and Radiation Processing, 2006, 24(4): 214-218
Authors:WANG Dehai  LUO Yan  CAI Yanqing
Affiliation:College of Chemical Engineering and Materials Science, Zhejiang University of Technology, Hangzhou 310014
Abstract:Stereolithography (SL) is a process in which the 3D object is finished by the layer-by-layer curing, so the surface properties of the cured materials have notable effects on the bonding power between the layers. In order to investigate the properties and influence factors of the UV cured surface formed by the epoxy acrylate, probe compo-nents were used, and the surface properties of the cured films were characterized by means of contact angle meas-urement and ATR-FTIR analysis. The results showed that the probe components migrated during the curing process, which causes the inhomogeneity distribution of their contents from surface to inner of the layer, and in turn influences the surface energy of the cured layers. Notwithstanding their very low concentrations (0.01%) , the probe components caused a drastic change in the surface energy of the layers (Deuchem 467 made the surface energy decrease from 51.32 mJ m-2 to 35.05 mJ m-2 ). Besides, the diversity of the surface energy of the surface and interface was also ob-served. In conclusion, both chemical nature of the probe components and the curing process (curing atmosphere and substrates, etc) can affect the migration extent of the probe components.
Keywords:Layers   Surface energy   Probe components   Migration   Attenuated total reflectance-Fourier trans- form infrared
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