Fast High-Resolution Simulation of the Gross Slip Wear of Axially Symmetric Contacts |
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| Authors: | A. V. Dimaki A. I. Dmitriev N. Menga A. Papangelo M. Ciavarella |
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| Affiliation: | 1. Tomsk State University, Tomsk, Russia;2. Institute of Strength Physics and Materials Science, Russian Academy of Science, Tomsk, Russia;3. National Tomsk Polytechnic University, Tomsk, Russia;4. Politecnico di BARI, Bari, Italy |
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| Abstract: | In the present article, we study the development of a wear profile in an axially symmetric contact under conditions of gross slip and assumption of the Reye-Archard wear criterion. Simulations are carried out using the method of dimensionality reduction and a full finite element method (FEM) formulation. The calculation time of the proposed model is several orders lower than that of FEM-based models and allows for much higher spatial resolution. |
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| Keywords: | Wear fretting computation |
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