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基于性能退化数据的金属化膜电容器可靠性评估
引用本文:赵建印,刘芳,孙权,周经伦. 基于性能退化数据的金属化膜电容器可靠性评估[J]. 电子学报, 2005, 33(2): 378-381
作者姓名:赵建印  刘芳  孙权  周经伦
作者单位:国防科学技术大学人文与管理学院系统工程研究所,湖南长沙 410073
基金项目:国家高技术研究发展计划(863计划)
摘    要:在对激光惯性约束聚变试验装置所用金属化膜脉冲电容器进行可靠性分析时,利用假设其寿命分布为Weibull分布的传统可靠性分析方法所得结果不能满足工程要求.作者通过分析电容的退化机理,给出了一个该型电容器的寿命分布模型,模型的求解是利用电容器的退化数据进行的,它具有比Weibull分布模型更为精确的特点,在工程实践中使用该模型对该型电容器进行可靠性分析可以大量的节约试验成本且结果精度更高.

关 键 词:金属化膜电容器  可靠性  退化失效  惯性约束聚变(ICF)激光装置  
文章编号:0372-2112(2005)02-0378-04
收稿时间:2004-02-23

Reliability Estimate of Metallized-Film Pulse Capacitor from Degradation Data
ZHAO Jian-yin,LIU Fang,SUN Quan,ZHOU Jing-lun. Reliability Estimate of Metallized-Film Pulse Capacitor from Degradation Data[J]. Acta Electronica Sinica, 2005, 33(2): 378-381
Authors:ZHAO Jian-yin  LIU Fang  SUN Quan  ZHOU Jing-lun
Affiliation:System Engineering Institute,National University of Defense Technology,Hunan,Changsha 410073,China
Abstract:High energy density self healing metallized film pulse capacitor is the key component of inertial confinement laser fusion facility.Generally,the Weibull distribution model is adopted as lifetime distribution to analyze the capacitor reliability,but the results can not satisfy the demands and the cost of tests is very high.By analyzing degradation mechanism of metallized film capacitor,this paper uses nonhomogeneous compound Poisson process to describe performance degradation process,and then presents a life distribution model of metallized film pulse capacitor.Using this model,we can analyze the capacitor reliability through degradation data.This technique can not only assess and verify reliability level of the capacitors but also save tests cost.
Keywords:metallized-film pulse capacitor  reliability  degradation failure  inertial confinement fusion laser facility
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